A microscope has been developed by Hitachi that doesn't use lens and instead, makes use of an irradiated electronic beam. The beam from the scanning electronic microscope helps analyze the diffraction pattern of the light, which is scattered. Not using a lens has it's own advantages and the most important is that distortion from aberration is limited in the prototype. A Transmission Electronic Microscope is used usually for atomic and electronic level observation. However, the high energy may result in the displacement of atoms and distortion and blurring could occur. But the principles behind an SEM solve most of these problems while the resolution remains the same as a TEM. Researchers at the Hokkaido University have developed an algorithm for a software that can be used to analyze the data from the microscope. The problem of noise signals remains a major issue and has to be solved before the microscope can be commercialized. Nanotechnology has also been used in the manufacturing of this electron analysis microscope.